Photoreflectance Spectroscopy Characterization of Ge/Si0.16Ge0.84Multiple Quantum Wells on Ge Virtual Substrate

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ژورنال

عنوان ژورنال: Advances in Condensed Matter Physics

سال: 2013

ISSN: 1687-8108,1687-8124

DOI: 10.1155/2013/298190